Author:
Shorin Vladimir S.,Sosnin Alexander N.
Subject
Instrumentation,Nuclear and High Energy Physics
Cited by
4 articles.
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1. Accurate ion beam analysis in the presence of surface roughness;Journal of Physics D: Applied Physics;2008-09-29
2. Backscattering analysis of thin films on non-flat surfaces;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1993-02
3. RBS spectra for thin films with surface roughness;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1992-12
4. Methods of adapting ion beam analysis techniques for use on curved surfaces;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1992-03