1. Intercomparison of ion beam analysis software for the simulation of backscattering spectra from two-dimensional structures;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2016-10
2. Computer simulation of ion beam analysis of laterally inhomogeneous materials;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2016-03
3. Effect of sample bias on backscattered ion spectroscopy in the helium ion microscope;Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films;2010-11
4. Hydrogen and oxygen concentration analysis of porous silicon;Journal of Non-Crystalline Solids;2008-10
5. Effects of multiple scattering and surface roughness on medium energy backscattering spectra;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2007-03