Author:
Behan G.,Feng J. F.,Zhang H. Z.,Nirmalraj P. N.,Boland J. J.
Subject
Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics
Cited by
7 articles.
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1. Ion Microscopy;Springer Handbook of Microscopy;2019
2. Visualization of steps and surface reconstructions in Helium Ion Microscopy with atomic precision;Ultramicroscopy;2016-03
3. Secondary Electron Generation in the Helium Ion Microscope: Basics and Imaging;Helium Ion Microscopy;2016
4. Effect of helium ion beam treatment on the etching rate of silicon nitride;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2015-04
5. Helium ion microscopy;Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena;2014-03