Molecular dynamics simulation of low energy ion beam mixing
Author:
Publisher
Elsevier BV
Subject
Instrumentation,Nuclear and High Energy Physics
Reference44 articles.
1. Distortion of depth profiles during sputtering
2. Theoretical aspects of atomic mixing by ion beams
3. Distortion of depth profiles during ion bombardment II. Mixing mechanisms
4. Recoil mixing in solids by energetic ion beams
5. A theoretical treatment of cascade mixing in depth profiling by sputtering
Cited by 6 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Molecular dynamics simulation of mass transport processes in a Ni crystal with Al atoms as impurity under low energy ion bombardment;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2001-02
2. Molecular dynamics simulation of defect formation in an aluminum crystal under low-energy ion bombardment;Physics of the Solid State;2001-01
3. Simulation of mass transport processes in a high temperature Ni crystal under low energy ion bombardment;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1999-06
4. MD simulation of atomic displacements in pure metals and metallic bilayers during low energy ion bombardment at 0 K;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1998-10
5. Calculation of marker distortion at elevated temperatures under low energy ion bombardment;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1997-09
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