Subject
Instrumentation,Nuclear and High Energy Physics
Reference55 articles.
1. Sputtering models—A synoptic view
2. J.M. Haile, Molecular Dynamics Simulation-Elementary Methods, Wiley-Interscience, New York, 1992, p. 386
3. A theoretical treatment of cascade mixing in depth profiling by sputtering
4. Recoil mixing in solids by energetic ion beams
5. U. Littmark, W.O Hofer, in: H. Oechsner (Ed.), Thin Film and Depth Profile Analysis, Springer, Berlin, 1984, p. 159
Cited by
14 articles.
订阅此论文施引文献
订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献