Author:
Knapp J.A.,Brice D.K.,Banks J.C
Subject
Instrumentation,Nuclear and High Energy Physics
Cited by
12 articles.
订阅此论文施引文献
订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. A high sensitivity microbeam RBS setup for heavy elements implantation profiles analysis;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2023-12
2. Heavy ion backscattering spectrometry at the University of Central Florida;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2004-06
3. Iron contamination in silicon technology;Applied Physics A: Materials Science & Processing;2000-05-01
4. Characterization and production metrology of thin transistor gate oxide films;Materials Science in Semiconductor Processing;1999-07
5. Simulation of multiple scattering background in heavy ion backscattering spectrometry;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1999-03