Subject
Instrumentation,Nuclear and High Energy Physics
Cited by
24 articles.
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1. Heavy ion backscattering spectrometry at the University of Central Florida;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2004-06
2. Iron contamination in silicon technology;Applied Physics A: Materials Science & Processing;2000-05-01
3. Simulation of multiple scattering background in heavy ion backscattering spectrometry;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1999-03
4. Increasing efficiency of ion-solid Monte Carlo simulations by using stratified sampling;Radiation Effects and Defects in Solids;1997-06
5. Ion beams in silicon processing and characterization;Journal of Applied Physics;1997-05-15