Some new possibilities in non-destructive depth profiling using secondary emission spectroscopy: REELS and EPES-Reference-Cited by-同舟云学术

登录注册会员服务联系我们

Some new possibilities in non-destructive depth profiling using secondary emission spectroscopy: REELS and EPES

Published:1986-07 Issue:7-9 Volume:36 Page:471-475
ISSN:0042-207X
Container-title:Vacuum
language:en
Short-container-title:Vacuum

Author:

Gergely G,Menyhárd M,Sulyok A

Publisher

Elsevier BV

Subject

Surfaces, Coatings and Films,Condensed Matter Physics,Instrumentation

Reference27 articles.

1. Practical Surface Analysis;Hofman,1983

2. American society for testing and materials, standard practice for elemental identification by Auger Electron Spectroscopy (E827-81)

3. American society for testing and materials, standard definitions of terms relating to surface analysis (E673-82)

4. National Physical Laboratory, Standard NPL No S7B83 and BCR No 261 Teddington, England.

5. Calculated and measured infrared reflectivity of diffused/implanted p-type silicon layers

Cited by 12 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Nanomorphology of Aluminum Oxide Layer after Argon Ion Bombardment;Journal of Nano Research;2015-05

2. Changes in a surface of polycrystalline aluminum upon bombardment with argon ions;Russian Journal of Physical Chemistry A;2014-08-31

3. Scanning Low-Energy Electron Microscopy;Advances in Imaging and Electron Physics;2003

4. EELS investigation of Pd thin film growth on aluminum oxide substrate;Journal of Electron Spectroscopy and Related Phenomena;2001-03

5. AES and EELS study of aluminium oxide thin films;Thin Solid Films;1998-04

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370

www.globalauthorid.com

TOP