Select transistor modulated cell array structure test application in EEPROM process reliability
Author:
Publisher
Elsevier BV
Subject
Materials Chemistry,Electrical and Electronic Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials
Reference3 articles.
1. Cast: An electrical stress test to monitor single bit failures in flash-EEPROM structures
2. Pio F, Gomiero E. Presented to the 10th Workshop on Dielectrics in Microelectronics, 1999 Nov 3–5; Barcelona. Microelectron Reliab 2000;40:719
3. Pio F, Gomiero E. Proceedings IEEE International Conference on Microelectronic Test Structures. ICMTS 2000, 2000 Mar 13–16, Monterey, CA
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