Data retention under gate stress on a NVM array-Reference-Cited by-同舟云学术

Data retention under gate stress on a NVM array

Published:2012-12 Issue: Volume:78 Page:80-86
ISSN:0038-1101
Container-title:Solid-State Electronics
language:en
Short-container-title:Solid-State Electronics

Author:

Djenadi R.,Micolau G.,Postel-Pellerin J.,Chiquet P.,Laffont R.,Ogier J.-L.,Regnier A.,Lalande F.,Melkonian J.

Publisher

Elsevier BV

Subject

Materials Chemistry,Electrical and Electronic Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Reference25 articles.

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