A new non-volatile memory architecture embedding microbatteries to improve data retention criterion

Author:

Postel-Pellerin J.,Chiquet P.,Lalande F.

Publisher

Elsevier BV

Subject

Materials Chemistry,Electrical and Electronic Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Reference25 articles.

1. Nonvolatile semiconductor memory technology: a comprehensive guide to understanding and to using NVSM devices;Brown,1998

2. Eeprom programming study-time and degradation aspects;Canet;Proc ISCAS,2001

3. A 0.18μm flash source side erasing improvement;Laffont;Proc NVMTS,2004

4. Study of signal programming to improve eeprom cells reliability;Canet;Proc MWSCAS,2000

5. Very fast eeprom erasing study;Canet;Proc ESSCIRC,2002

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