Dielectric properties of YSZ high-k thin films fabricated at low temperature by pulsed laser deposition
Author:
Publisher
Elsevier BV
Subject
Mechanical Engineering,Mechanics of Materials,Condensed Matter Physics,General Materials Science
Reference15 articles.
1. Pushing the Limits
2. Scaling the gate dielectric: Materials, integration, and reliability
3. Stacked high-ε gate dielectric for gigascale integration of metal–oxide–semiconductor technologies
4. Amorphous lanthanide-doped TiOx dielectric films
5. High-resolution depth profiling in ultrathin Al2O3 films on Si
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