Author:
Tuominen M,Ellison A,Tuomi T,Yakimova R,Milita S,Janzén E
Subject
Materials Chemistry,Inorganic Chemistry,Condensed Matter Physics
Reference14 articles.
1. D. Hobgood, V. Tsvetkov, R. Glass, D. Henshall, M. Brady, J. Jenny, G. Fechko, R. Leonard, D. Malta, S. Müller, C. Carter Jr., in: C. Carter Jr., R. Devaty, G. Rohrer (Eds.), Proceedings of the ICSCRM 1999, Trans. Tech. Publications Ltd., Vol. 1, 2000, pp. 3–8.
2. An optical and X-ray topographic study of giant screw dislocations in silicon carbide
3. Characterization of Defect Structures in Lely 6H-SiC Single Crystals Using Synchrotron White Beam X-Ray Topography
4. Defect analysis in Lely-grown 6H SiC
5. H. Posen, J.A. Bruce, Proceedings of the Third International Conference on Silicon Carbide, University South Carolina Press, Columbia, 1973, pp. 238–245.
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