An extensive survey on reduction of noise coupling in TSV based 3D IC integration

Author:

Pragathi Dadaipally,Prasad Dumpa,Padma Tatiparti,Rahul Reddy P.,Usha Kumari Ch.,Kumar Poola Praveen,Panigrahy Asisa Kumar

Publisher

Elsevier BV

Subject

General Medicine

Cited by 4 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. 3D integration of 2D electronics;Nature Reviews Electrical Engineering;2024-04-25

2. A Short Review of Through-Silicon via (TSV) Interconnects: Metrology and Analysis;Applied Sciences;2023-07-18

3. Design and Performance Analysis of 3D IC Integration Model for High Frequency and RF Applications;2023 International Conference on Computational Intelligence for Information, Security and Communication Applications (CIISCA);2023-06-22

4. Substrate noise evaluation for lightly doped 45nm N-MOSFET using physical simulation models;International Journal of Electronics;2023-02-20

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