Author:
Raghavan Gopal,Chiang Chien,Anders Paul B.,Tzeng Sing-Mo,Villasol Reynaldo,Bai Gang,Bohr Mark,Fraser David B.
Subject
Materials Chemistry,Metals and Alloys,Surfaces, Coatings and Films,Surfaces and Interfaces,Electronic, Optical and Magnetic Materials
Reference7 articles.
1. Diffusion of metals in silicon dioxide;McBrayer;J. Electrochem. Soc.,1986
2. Deep Impurities in Semiconductors;Milnes,1973
3. Impact of copper contamination on the quality of silicon oxides;Wendt;J. Appl. Phys.,1989
4. Copper transport in thermal SiO2;Shacham-Diamand;J. Electrochem. Soc.,1993
5. Dielectric barrier study for copper metallization;Chiang,1994
Cited by
156 articles.
订阅此论文施引文献
订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献