Profils de concentration obtenus par spectrométrie auger et décapage ionique: Influence du gradient de concentration et détermination de la profondeur analysée-Reference-Cited by-同舟云学术

Profils de concentration obtenus par spectrométrie auger et décapage ionique: Influence du gradient de concentration et détermination de la profondeur analysée

Published:1980-04 Issue:2-3 Volume:94 Page:424-434
ISSN:0039-6028
Container-title:Surface Science
language:fr
Short-container-title:Surface Science

Author:

Guglielmacci J.M.,Gillet M.

Publisher

Elsevier BV

Subject

Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics

Reference17 articles.

1. Use of Auger Electron Spectroscopy and Inert Gas Sputtering for Obtaining Chemical Profiles

2. Characterization of Solid Surfaces;Chang,1974

3. Depth resolution and surface roughness effects in sputter profiling of NiCr multilayer sandwich samples using Auger electron spectroscopy

4. Study of interdiffusion of Ni/Fe layers by Auger Sputter profiling

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1. Characterization of intermixing at metal-semiconductor interfaces by angle-resolved Auger-electron emission: Cu/Si(111)-7×7;Physical Review B;1985-05-15

2. Routine semi-quantitative AES analysis of industrial surfaces;Applications of Surface Science;1985-05

3. Ion-Bombardment-Induced Composition Changes in Alloys and Compounds;Ion Implantation and Beam Processing;1984

4. Quantitative Auger Electron Spectroscopy;Advances in Electronics and Electron Physics Volume 61;1983

5. Surface analysis: x-ray photoelectron spectroscopy, Auger electron spectroscopy, and secondary ion mass spectrometry;Analytical Chemistry;1982-04-01