Surface analysis: x-ray photoelectron spectroscopy, Auger electron spectroscopy, and secondary ion mass spectrometry-Reference-Cited by-同舟云学术

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Surface analysis: x-ray photoelectron spectroscopy, Auger electron spectroscopy, and secondary ion mass spectrometry

Published:1982-04-01 Issue:5 Volume:54 Page:293-322
ISSN:0003-2700
Container-title:Analytical Chemistry
language:en
Short-container-title:Anal. Chem.

Author:

Turner Noel H.,Colton Richard J.

Publisher

American Chemical Society (ACS)

Subject

Analytical Chemistry

Link

https://pubs.acs.org/doi/pdf/10.1021/ac00242a027

Cited by 48 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

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2. Pulsed Microdischarge with Inductively Coupled Plasma Mass Spectrometry for Elemental Analysis on Solid Metal Samples;Analytical Chemistry;2015-04-17

3. Simultaneous doping and heterojunction of silver on Na2Ta2O6nanoparticles for visible light driven photocatalysis: the relationship between tunable optical absorption, defect chemistry and photocatalytic activity;CrystEngComm;2015

4. Molybdate-Based Conversion Coatings for Aluminum Alloys Part II: Coating Chemistry;ECS Transactions;2013-04-02

5. Secondary Electrons in EUV Lithography;Journal of Photopolymer Science and Technology;2013

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