Routine semi-quantitative AES analysis of industrial surfaces
Author:
Publisher
Elsevier BV
Subject
General Engineering
Reference27 articles.
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1. Surface characterization study of indium phosphide(100) substrates using ISS, AES, and ESCA. Part 3. Experimental artifacts;Chemistry of Materials;1991-01-01
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3. Sensitivity factors for KL2,3L2,3 transitions for light elements in auger electron spectroscopy;Journal of Electron Spectroscopy and Related Phenomena;1989-01
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5. Quantitative Auger analysis of complex electrical contact alloy materials;Applied Surface Science;1987-07
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