Reconstructions and phase transitions of Ge on the Si(111)7 × 7 surface
Author:
Publisher
Elsevier BV
Subject
Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics
Reference12 articles.
1. Structure analysis of Si(111)-7 × 7 reconstructed surface by transmission electron diffraction
2. Structural analysis of Si(111)‐7×7 by UHV‐transmission electron diffraction and microscopy
3. Surface structure imaging by electron microscopy
4. Surface Electronic Structure of Si (111)-(7×7) Resolved in Real Space
5. Tunneling microscopy of silicon and germanium: Si(111)7×7, SnGe(111)7×7, GeSi(111)5×5, Si(111)9×9, Ge(111)2×8, Ge(100)2×1, Si(110)5×1
Cited by 29 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. Formation and optical properties of Ge films grown on Si(111) substrates using nanocontact epitaxy;Applied Surface Science;2015-01
2. Electron-phonon coupling on strained Ge/Si(111)-(5×5) surfaces;Physical Review B;2012-11-30
3. Effect of Ge passivation on interfacial properties of crystalline Gd2O3 thin films grown on Si substrates;Applied Physics Letters;2010-02-15
4. Ge(5×5) as a wetting layer on Si(111);Surface Science;2009-02
5. Scanning Tunneling Microscopy of the Si(111)-7×7 Surface and Adsorbed Ge Nanostructures;Applied Scanning Probe Methods XII;2009
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