Direct, simultaneous determination of XPS background and inelastic differential cross section using Tougaard's algorithm
Author:
Publisher
Elsevier BV
Subject
Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics
Reference23 articles.
1. Inelastic background correction and quantitative surface analysis
2. Energy loss functions derived by Monte Carlo simulation from the Au 4f XPS spectrum
3. Inelastic-electron-scattering cross sections for Si, Cu, Ag, Au, Ti, Fe, and Pd
4. A successive quadratic programming algorithm with global and superlinear convergence properties
5. A numerically stable dual method for solving strictly convex quadratic programs
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