Analysis of nanoparticles and nanomaterials using X-ray photoelectron spectroscopy-Reference-Cited by-同舟云学术

Analysis of nanoparticles and nanomaterials using X-ray photoelectron spectroscopy

Published:2023-05-27 Issue:2 Volume:18 Page:135-167
ISSN:2686-7575
Container-title:Fine Chemical Technologies
language:
Short-container-title:Fine Chem. Technol.

Author:

Ischenko A. A.¹^ORCID,Lazov M. A.¹^ORCID,Mironova E. V.¹^ORCID,Putin A. Yu.¹^ORCID,Ionov A. M.²^ORCID,Storozhenko P. A.³

Affiliation:

1. M.V. Lomonosov Institute of Fine Chemical Technologies, MIREA - Russian Technological University

2. Institute of Solid State Physics, Russian Academy of Sciences

3. GNIIKHTEOS

Abstract

Objectives. The main aim of this review is to summarize the existing knowledge on the use of X-ray photoelectron spectroscopy (XPS) for the characterization of nanoparticles and nanomaterials.Results. XPS or electron spectroscopy for chemical analysis can provide information on the qualitative and quantitative composition, valence states of the elements of the samples under study, the chemical composition of the surface and interfaces that determine the properties of nanoparticles and nanostructured materials. The review describes the role of several different methods for the characterization of nanomaterials, highlights their advantages and limitations, and the possibilities of an effective combination. The main characteristics of XPS are described. Various examples of its use for the analysis of nanoparticles and nanomaterials are given in conjunction with additional methods to obtain complementary information about the object under study.Conclusions. XPS provides depth information comparable to the size of nanoparticles (up to 10 nm depth from the surface) and does not cause significant damage to the samples. Two disadvantages of XPS analysis are sample preparation requiring a dry solid form without contaminations and data interpretation. XPS provides information not only on the chemical identity, but also on the dielectric properties of nanomaterials, recording their charging/discharging behavior. Chemical information from the surface of nanoparticles analyzed by XPS can be used to estimate the thickness of nanoparticle coatings. XPS has a high selectivity, since the resolution of the method makes it possible to distinguish a characteristic set of lines in the photoelectron spectrum at kinetic energies determined by the photon energy and the corresponding binding energies in elements. The intensity of the lines depends on the concentration of the respective element. Obtaining a sufficiently complete picture of the properties of nanomaterials requires the use of a group of complementary instrumental methods of analysis.

Publisher

RTU MIREA

Subject

Inorganic Chemistry,Organic Chemistry,Fluid Flow and Transfer Processes,Process Chemistry and Technology

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