The use of secondary ion mass spectrometry for studies of oxygen adsorption and oxidation
Author:
Publisher
Elsevier BV
Subject
Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics
Reference42 articles.
1. K. Wittmaack, in: Inelastic Ion-Surface Collisions, Eds. N.H. Tolk, J.C. Tully, W. Heiland and C.W. White (Academic Press, in press).
2. Implications in the use of secondary ion mass spectrometry to investigate impurity concentration profiles in solids
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5. Ion beam sputtering - the effect of incident ion energy on atomic mixing in subsurface layers
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