SIMS analysis of xenon and krypton in uranium dioxide: A comparison of two models of gas-phase ionisation
Author:
Publisher
Elsevier BV
Subject
Instrumentation,Nuclear and High Energy Physics
Reference24 articles.
1. Systematics of secondary‐ion‐mass spectrometry relative sensitivity factors versus electron affinity and ionization potential for a variety of matrices determined from implanted standards of more than 70 elements
2. Sur la formation retardée d'ions a l'extérieur d'une cible soumise à un bombardement ionique
3. Gas-phase ionisation of sputtered rare gas atoms
4. Characterisation of irradiated nuclear fuel with SIMS
Cited by 7 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Insights into secondary ion formation during dynamic SIMS analysis: Evidence from sputtering of laboratory synthesized uranium compounds with a high-energy O− primary beam on a NanoSIMS 50L;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2021-09
2. Diagnosis of Trace Toxic Uranium Ions in Organic Liver Cell;Toxicological Research;2014-06-30
3. Unravelling the secrets of Cs controlled secondary ion formation: Evidence of the dominance of site specific surface chemistry, alloying and ionic bonding;Surface Science Reports;2013-03
4. The effect of lattice and grain boundary diffusion on the redistribution of Xe in metallic nuclear fuels: Implications for the use of ion implantation to study fission-gas-bubble nucleation mechanisms;Journal of Nuclear Materials;2011-08
5. First experimental evidence by SIMS of different surface binding energies for uranium according to its oxidation state;Applied Surface Science;2011-05
1.学者识别学者识别
2.学术分析学术分析
3.人才评估人才评估
"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370
www.globalauthorid.com
TOP
Copyright © 2019-2024 北京同舟云网络信息技术有限公司 京公网安备11010802033243号 京ICP备18003416号-3