Direct imaging of dopant distributions across the Si-metallization interfaces in solar cells: Correlative nano-analytics by electron microscopy and NanoSIMS-Reference-Cited by-同舟云学术

Direct imaging of dopant distributions across the Si-metallization interfaces in solar cells: Correlative nano-analytics by electron microscopy and NanoSIMS

Published:2017-02 Issue: Volume:160 Page:398-409
ISSN:0927-0248
Container-title:Solar Energy Materials and Solar Cells
language:en
Short-container-title:Solar Energy Materials and Solar Cells

Author:

Kumar Praveen,Pfeffer Michael,Willsch Benjamin,Eibl Oliver,Yedra Lluís,Eswara Santhana,Audinot Jean-Nicolas,Wirtz Tom

Funder

National Research Fund of Luxembourg

Publisher

Elsevier BV

Subject

Surfaces, Coatings and Films,Renewable Energy, Sustainability and the Environment,Electronic, Optical and Magnetic Materials

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