Author:
Vairagar A.V.,Mhaisalkar S.G.,Krishnamoorthy Ahila
Subject
Materials Chemistry,Metals and Alloys,Surfaces, Coatings and Films,Surfaces and Interfaces,Electronic, Optical and Magnetic Materials
Reference19 articles.
1. Physics of Failure in Electronics;Blech,1966
2. Electromigration reliability issues in dual-damascene Cu interconnections
3. Copper metallization reliability
4. Proc. of IEEE VLSI Multilevel Interconnection Conference, IEEE,1991
5. Proc. of IEEE International Interconnect Technology Conference, IEEE;Sato,2001
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