Author:
Defranoux C.,Emeraud T.,Bourtault S.,Venturini J.,Boher P.,Hernandez M.,Laviron C.,Noguchi T.
Subject
Materials Chemistry,Metals and Alloys,Surfaces, Coatings and Films,Surfaces and Interfaces,Electronic, Optical and Magnetic Materials
Reference10 articles.
1. IR spectroscopic ellipsometry: instrumentation and applications in semiconductors
2. High accuracy IR ellipsometer working with a Ge Brewster angle reflection polarizer and grid analyzer
3. P. Boher, J.-P. Piel, P. Evrard, J.-L. Stehlé, Proc. EMRS (1999)
4. C. Pickering, W.Y. Leong, J. Glasper, P. Boher, J.P. Piel, EMRS Spring Meeting, Strasbourg, 5–8 june (2001)
5. M. Lutmann, P. Boher, J.L. Stehle, ‘Ellipsomètre à haute resolution spatiale fonctionnant dans l'infrarouge’, Patent N° 0009318, (2001)
Cited by
7 articles.
订阅此论文施引文献
订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献