Spectroscopic ellipsometry and its applications in the study of thin film materials-Reference-Cited by-同舟云学术

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Spectroscopic ellipsometry and its applications in the study of thin film materials

Published:2019 Issue:6 Volume:12 Page:1195-1234
ISSN:2095-1531
Container-title:Chinese Optics
language:en
Short-container-title:中国光学

Author:

ZHU Xu-dan 朱绪丹,ZHANG Rong-jun 张荣君,ZHENG Yu-xiang 郑玉祥,WANG Song-you 王松有,CHEN Liang-yao 陈良尧

Publisher

Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of Sciences

Subject

Atomic and Molecular Physics, and Optics

Cited by 13 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Multi-layer structured AlN/Er2O3 coating: Enhanced thermal stability and hydrogen isotope permeation resistance;Ceramics International;2024-07

2. Sensitivity Improvements for Picosecond Ultrasonic Thickness Measurements in Gold and Tungsten Nanoscale Films;Nanomanufacturing and Metrology;2024-03-26

3. Measurement of Nanoscale Film Thickness Using Neutron Depth Profiling Technique;ACS Applied Materials & Interfaces;2023-07-11

4. 空间调制型偏振检测技术研究现状及发展趋势;Acta Optica Sinica;2023

5. Oil-film extinction coefficient inversion based on thickness difference;Optics Express;2022-08-03

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