Determination of the thickness of polycrystalline thin films by using X-ray methods-Reference-Cited by-同舟云学术

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Determination of the thickness of polycrystalline thin films by using X-ray methods

Published:2015-09 Issue: Volume:591 Page:215-218
ISSN:0040-6090
Container-title:Thin Solid Films
language:en
Short-container-title:Thin Solid Films

Author:

Daniš S.,Matĕj Z.,Matĕjová L.,Krupka M.

Funder

Grant Agency of the Czech Republic

Publisher

Elsevier BV

Subject

Materials Chemistry,Metals and Alloys,Surfaces, Coatings and Films,Surfaces and Interfaces,Electronic, Optical and Magnetic Materials

Reference6 articles.

1. High-Resolution X-Ray Scattering;Pietsch,2004

2. Coplanar grazing-exit X-ray diffraction on polycrystalline films;Matĕj;Z. Kristallogr. Suppl.,2009

3. Micro X-Ray diffraction analysis of thin films using grazing-exit conditions;Noma;J. Synchrotron Radiat.,1998

4. Surface-sensitive X-ray fluorescence and diffraction analysis with grazing-exit geometry;Noma;X-Ray Spectrom.,1999

5. Grazing excidence diffraction versus grazing incidence diffraction for strain/stress evaluation in thin films;Njeh;Powder Diffract.,2000

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1. Recent Progresses in Nanometer Scale Analysis of Buried Layers and Interfaces in Thin Films by X-rays and Neutrons;Analytical Sciences;2020-08-10

2. Surface Structure of MgO Thin Films Revealed from X-ray Reflectivity and Near-Edge X-ray Absorption Fine Structure Measurements;Science of Advanced Materials;2018-09-01

3. Hydrogen sorption by Ni-coated titanium alloy VT1-0;International Journal of Hydrogen Energy;2017-04

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