Coplanar grazing exit X-ray diffraction on thin polycrystalline films
Author:
Publisher
Walter de Gruyter GmbH
Subject
Inorganic Chemistry,Condensed Matter Physics,General Materials Science
Reference8 articles.
1. Grazing incidence synchrotron x-ray diffraction method for analyzing thin films
2. Micro X-ray diffraction analysis of thin films using grazing-exit conditions
3. Surface-sensitive x-ray fluorescence and diffraction analysis with grazing-exit geometry
4. Grazing excidence diffraction versus grazing incidence diffraction for strain/stress evaluation in thin films
5. Grazing exit small angle X-ray scattering on grain formation in polycrystalline metal films
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1. Development of an Evaluation Method for a Lithium/Electrolyte Interface Based on X-ray Reflectivity and Grazing Incidence X-ray Scattering Measurements;Chemistry Letters;2021-05-20
2. Grazing Incidence X-Ray Diffraction Study of Tantalum Thin Films;Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques;2018-07
3. Determination of the thickness of polycrystalline thin films by using X-ray methods;Thin Solid Films;2015-09
4. XRD total pattern fitting applied to study of microstructure of TiO2films;Powder Diffraction;2010-06
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