Surface Structure of MgO Thin Films Revealed from X-ray Reflectivity and Near-Edge X-ray Absorption Fine Structure Measurements-Reference-Cited by-同舟云学术

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Surface Structure of MgO Thin Films Revealed from X-ray Reflectivity and Near-Edge X-ray Absorption Fine Structure Measurements

Published:2018-09-01 Issue:9 Volume:10 Page:1372-1376
ISSN:1947-2935
Container-title:Science of Advanced Materials
language:en
Short-container-title:sci adv mater

Author:

Singh Jitendra Pal,Lim Weon Cheol,Lee Ik-Jae,Won Sung OK,Chae Keun Hwa

Publisher

American Scientific Publishers

Subject

General Materials Science

Cited by 14 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Local Electronic Structure of MgO: Impact of Deposition Time and Ion Irradiation;Prabha Materials Science Letters;2024-09-30

2. Growth strategies of Li7La3Zr2O12 electrolytes for Li-ion thin film battery;Chemical Engineering Journal Advances;2023-11

3. Kinetic Monte Carlo modeling of oxide thin film growth;The Journal of Chemical Physics;2022-06-07

4. Mg Defect Induced Ferromagnetic Ordering in Li-Doped MgO Nanostructures;ECS Journal of Solid State Science and Technology;2021-08-01

5. MgO Thin Film Growth on Si(001) by Radio-Frequency Sputtering Method;Journal of Nanoscience and Nanotechnology;2020-12-01

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