Study of Al2O3 nanolayers synthesized onto porous SiO2 using X-ray reflection spectroscopy-Reference-Cited by-同舟云学术

登录注册会员服务联系我们

Study of Al2O3 nanolayers synthesized onto porous SiO2 using X-ray reflection spectroscopy

Published:2013-05 Issue: Volume:534 Page:363-366
ISSN:0040-6090
Container-title:Thin Solid Films
language:en
Short-container-title:Thin Solid Films

Author:

Konashuk A.S.,Sokolov A.A.,Drozd V.E.,Schaefers F.,Filatova E.O.

Publisher

Elsevier BV

Subject

Materials Chemistry,Metals and Alloys,Surfaces, Coatings and Films,Surfaces and Interfaces,Electronic, Optical and Magnetic Materials

Reference32 articles.

1. Low dielectric constant materials for microelectronics

2. Ab initiostudy of the physical properties ofγ-Al2O3: Lattice dynamics, bulk properties, electronic structure, bonding, optical properties, and ELNES/XANES spectra

Cited by 7 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Correlative Atomic Coordination and Interfacial Charge Polarity in Al ₂ O ₃ /GaN and Al ₂ O ₃ /Si Heterostructures;physica status solidi (RRL) – Rapid Research Letters;2022-12-28

2. Correlating electron trapping and structural defects in Al2O3 thin films deposited by plasma enhanced atomic layer deposition;AIP Advances;2020-12-01

3. Re-distribution of oxygen at the interface between γ-Al2O3 and TiN;Scientific Reports;2017-07-03

4. Structural and morphological characterization of Al2O3 coated macro-porous silicon by atomic layer deposition;Thin Solid Films;2016-10

5. Metallization-Induced Oxygen Deficiency of γ-Al2O3 Layers;The Journal of Physical Chemistry C;2016-04-15

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370

www.globalauthorid.com

TOP