Author:
Urban F.K.,Barton D.,Tiwald T.
Subject
Materials Chemistry,Metals and Alloys,Surfaces, Coatings and Films,Surfaces and Interfaces,Electronic, Optical and Magnetic Materials
Reference6 articles.
1. Ellipsometry and Polarized Light;Azzam,1977
2. Real time, in-situ ellipsometry solutions using artificial neural network pre-processing;Urban;Thin Solid Films,1994
3. Survey of methods to characterize thin absorbing films with spectroscopic ellipsometry;Hilfiker;Thin Solid Films,2008
4. Numerical ellipsometry: ellipsometer analysis in the n–k plane for growing films on unknown homogeneous, isotropic substrates and unknown, layered substrates;Urban;Thin Solid Films,2008
5. Numerical ellipsometry: ellipsometer analysis in the n–k plane for select combinations of metals, semiconductors, and insulators;Urban;Thin Solid Films,2008
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