Author:
Hilfiker James N.,Singh Neha,Tiwald Tom,Convey Diana,Smith Steven M.,Baker Jeffrey H.,Tompkins Harland G.
Subject
Materials Chemistry,Metals and Alloys,Surfaces, Coatings and Films,Surfaces and Interfaces,Electronic, Optical and Magnetic Materials
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2. Techniques for ellipsometric measurement of the thickness and optical constants of thin absorbing films
3. Handbook of Ellipsometry,2005
4. Spectroscopic Ellipsometry Principles and Applications;Fujiwara,2007
5. Ellipsometry and Polarized Light;Azzam,1977
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