Numerical ellipsometry: Ellipsometer analysis in the n–k plane for select combinations of metals, semiconductors, and insulators
Author:
Publisher
Elsevier BV
Subject
Materials Chemistry,Metals and Alloys,Surfaces, Coatings and Films,Surfaces and Interfaces,Electronic, Optical and Magnetic Materials
Reference6 articles.
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2. F.L. McCrakin and J.P. Colson, A Fortran program for analysis of ellipsometer measurements and calculation of reflection, Dept. of Commerce, National Bureau of Standards: USGPO (1964).
3. Numerical ellipsometry: enhancement of new algorithms for real-time, in situ film growth monitoring;Urban;Thin Solid Films,1994
4. Numerical ellipsometry: real-time solutions using mapping onto the complex index plane;Barton;J. Vac. Sci. Tech. A,1996
5. Functions of One Complex Variable II;Conway,1995
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