Morphological, optical and electrical properties of samarium oxide thin films-Reference-Cited by-同舟云学术

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Morphological, optical and electrical properties of samarium oxide thin films

Published:2012-08 Issue:20 Volume:520 Page:6393-6397
ISSN:0040-6090
Container-title:Thin Solid Films
language:en
Short-container-title:Thin Solid Films

Author:

Constantinescu Catalin,Ion Valentin,Galca Aurelian C.,Dinescu Maria

Publisher

Elsevier BV

Subject

Materials Chemistry,Metals and Alloys,Surfaces, Coatings and Films,Surfaces and Interfaces,Electronic, Optical and Magnetic Materials

Reference43 articles.

1. High-κ gate dielectrics: Current status and materials properties considerations

2. Reliability and integration of ultra-thin gate dielectrics for advanced CMOS

3. Modeling and simulation of tunneling through ultra-thin gate dielectrics

4. Intermixing at the tantalum oxide/silicon interface in gate dielectric structures

5. Effect of growth temperature on the properties of evaporated tantalum pentoxide thin films on silicon deposited using oxygen radicals

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