Author:
Wu Meiyi,de Marneffe Jean-François,Opsomer Karl,Detavernier Christophe,Delabie Annelies,Naujok Philipp,Caner Özge,Goodyear Andy,Cooke Mike,Saadeh Qais,Soltwisch Victor,Scholze Frank,Philipsen Vicky
Funder
Electronic Components and Systems for European Leadership
European Commission
Subject
Electrical and Electronic Engineering,Surfaces, Coatings and Films,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference22 articles.
1. Characterization and mitigation of 3D mask effects in extreme ultraviolet lithography;Erdmann;Adv. Opt. Technol.,2017
2. Reducing extreme ultraviolet mask three-dimensional effects by alternative metal absorbers;Philipsen;J. Micro Nanolithogr. MEMS MOEMS,2017
3. Proc. SPIE 11147, EUVL;Franke,2019
4. Alternative materials for high numerical aperture extreme ultraviolet lithography mask stacks;Wood;Proc. SPIE,2015
5. Novel EUV mask absorber evaluation in support of next-generation EUV imaging;Philipsen;Proc. SPIE,2018
Cited by
8 articles.
订阅此论文施引文献
订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献