Accuracy Study of Calorimetric Switching Loss Energy Measurements for Wide Bandgap Power Transistors
Author:
Affiliation:
1. University of Stuttgart,Institute of Robust Power Semiconductor Systems,Stuttgart,Germany,70569
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/9570185/9570186/09570481.pdf?arnumber=9570481
Reference10 articles.
1. Accuracy Analysis of Calorimetric Loss Measurement for Benchmarking Wide Bandgap Power Transistors under Soft-Switching Operation
2. New calorimetric power transistor soft-switching loss measurement based on accurate temperature rise monitoring
3. Loss Separation in Hard- and Soft-Switching GaN HEMTs operated in a 10 kW Isolated DC/DC Converter
4. Experimental Characterization of Silicon and Gallium Nitride 200 V Power Semiconductors for Modular/Multi-Level Converters Using Advanced Measurement Techniques
5. Soft-Switching Losses in GaN and SiC Power Transistors Based on New Calorimetric Measurements
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