Switching Loss Measurement – A Thermal Approach Applied to GaN-Half-Bridge Configuration
Author:
Affiliation:
1. Friedrich-Alexander University Erlangen-Nürnberg (FAU),Electromagnetic Fields,Erlangen,Germany,91058
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/9570185/9570186/09570614.pdf?arnumber=9570614
Reference23 articles.
1. P6022 Current Probe Instruction Manual,2000
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