Trace Elemental Determination Using a Portable Total Reflection X-Ray Fluorescence Spectrometer with a Collodion Film Sample Holder
Author:
Affiliation:
1. Department of Industrial Chemistry, Faculty of Engineering, Tokyo University of Science
Publisher
Springer Science and Business Media LLC
Subject
Analytical Chemistry
Link
https://www.jstage.jst.go.jp/article/analsci/33/5/33_635/_pdf
Reference11 articles.
1. 1. Y. Yoneda and T. Horiuchi, Rev. Sci. Instrum., 1971, 42, 1069.
2. 2. P. Wobrauschek, X-Ray Spectrom., 2007, 36, 289.
3. 3. R. Klockenkämper and A. von Bohlen, “Total Reflection X-ray Fluorescence Analysis and Related Methods”, 2nd ed., 2015, John Wiley and Sons, NJ.
4. 4. M. Schmitt, P. Hoffmann, and K. H. Lieser, Fresenius’ Z Anal. Chem., 1987, 328, 594.
5. 5. P. Hoffmann, K. H. Lieser, M. Hein, and M. Flakowski, Spectrochim. Acta, Part B, 1989, 44, 471.
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