Improvement in a Method for Trace Element Analysis Method Using a Portable Total Reflection X-ray Fluorescence Spectrometer-Reference-Cited by-同舟云学术

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Improvement in a Method for Trace Element Analysis Method Using a Portable Total Reflection X-ray Fluorescence Spectrometer

Published:2019-05-05 Issue:5 Volume:68 Page:325-332
ISSN:0525-1931
Container-title:BUNSEKI KAGAKU
language:en
Short-container-title:Bunseki kagaku

Author:

KUNIMURA Shinsuke¹,SUGAWARA Yugo¹,TOKUOKA Yoshie¹,AONO Umina¹,SUGIOKA Taishiro¹,FUKUROI Yuka¹,TERADA Shuichiro¹

Affiliation:

1. Department of Industrial Chemistry, Tokyo University of Science

Publisher

Japan Society for Analytical Chemistry

Subject

Analytical Chemistry

Link

https://www.jstage.jst.go.jp/article/bunsekikagaku/68/5/68_325/_pdf

Reference19 articles.

1. 1) Y. Yoneda, T. Horiuchi : Rev. Sci. Instrum., 42, 1069 (1971).

2. 2) P. Wobrauschek : X-Ray Spectrom., 36, 289 (2007).

3. 3) R. Klockenkämper, A. von Bohlen : “Total Reflection X-ray Fluorescence Analysis and Related Methods, 2nd Edition”, (2015), (John Wiley and Sons, New Jersey).

4. 4) A. Iida, Y. Gohshi : Jpn. J. Appl. Phys., 23, 1543 (1984).

5. 5) K. Sakurai, H. Eba, K. Inoue, N. Yagi : Anal. Chem., 74, 4532 (2002).

Cited by 1 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Portable Total Reflection X-ray Fluorescence Spectrometer with a Detection Limit in the 100 ng/L Range;ISIJ International;2022-05-15

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