Investigation of the giant step bunching induced by the etching of 4H-SiC in Ar–H2mix gases
Author:
Publisher
IOP Publishing
Subject
General Physics and Astronomy,Physics and Astronomy (miscellaneous),General Engineering
Link
http://stacks.iop.org/1347-4065/55/i=9/a=095501/pdf
Reference31 articles.
1. Relation between Defects on 4H-SiC Epitaxial Surface and Gate Oxide Reliability
2. Simulation Studies on Giant Step Bunching Accompanying Trapezoid-Shape Defects in 4H-SiC Epitaxial Layer
3. Physics of Crystal Growth
4. Investigation of giant step bunching in 4H-SiC homoepitaxial growth: Proposal of cluster effect model
5. Spontaneous ordering of nanostructures on crystal surfaces
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1. Hydrogen Etching Process of 4H-SiC (0001) in Limited Regions;Solid State Phenomena;2024-08-22
2. Image analysis development for optimization of 4H–SiC trench recovery treatment by combination of gas etching and sacrificial oxidation approaches;Materials Science in Semiconductor Processing;2024-05
3. Step unbunching phenomenon on 4H-SiC (0001) surface during hydrogen etching;Applied Physics Letters;2023-07-17
4. Toward the Reproducible Growth of Graphene on Wide SiC Steps: A Study of the Geometric Properties of 4H-SiC (0001) Substrates;Materials Science Forum;2022-05-31
5. Features and Prospects for Epitaxial Graphene on SiC;Handbook of Graphene;2019-06-17
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