Maximum usable thickness revisited: Imaging dislocations in Si by modern high-voltage scanning transmission electron microscopy
Author:
Funder
Japan Society for the Promotion of Science
Publisher
IOP Publishing
Subject
General Physics and Astronomy,Physics and Astronomy (miscellaneous),General Engineering
Link
http://stacks.iop.org/1347-4065/56/i=10/a=100304/pdf
Reference22 articles.
1. Metallurgical Investigations with a 500 kV Electron Microscope
2. The Observation of Thick Specimens by High Voltage Electron Microscopy. II. Experiment with Molybdenite Films at 50-1200 kV.
3. Increase in Penetration of Electron Microscope Specimens at High Voltages
4. Some Applications of an Ultra-High Voltage Electron Microscope on Materials Science
5. Voltage Dependence of the Maximum Observable Thickness by Electron Microscopy Up to 3 MV
Cited by 9 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Advances in Characterization of Thick Specimens and Time-Resolved <i>In-situ</i> Observation by Modern High Voltage Electron Microscopy;Materia Japan;2024-04-01
2. Experimental evaluation of usable specimen thickness of Si for lattice imaging by transmission electron microscopy at 300 kV;Ultramicroscopy;2024-02
3. Review of “12th Japanese-Polish Joint Seminar on Micro and Nano Analysis (August 29–September 1, 2018)”;MATERIALS TRANSACTIONS;2021-09-01
4. Rapid defect characterization: The efficiency of diffraction contrast‐scanning transmission electron microscopy;Microscopy Research and Technique;2020-07-31
5. Athermal Crystal Defect Dynamics in Si Revealed by Cryo-High-Voltage Electron Microscopy;ACS Omega;2020-01-08
1.学者识别学者识别
2.学术分析学术分析
3.人才评估人才评估
"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370
www.globalauthorid.com
TOP
Copyright © 2019-2024 北京同舟云网络信息技术有限公司 京公网安备11010802033243号 京ICP备18003416号-3