Resource-constrained system-on-a-chip test: a survey-Reference-Cited by-同舟云学术

Resource-constrained system-on-a-chip test: a survey

Published:2005 Issue:1 Volume:152 Page:67
ISSN:1350-2387
Container-title:IEE Proceedings - Computers and Digital Techniques
language:en
Short-container-title:IEE Proc., Comput. Digit. Tech.

Author:

Xu Q.,Nicolici N.

Publisher

Institution of Engineering and Technology (IET)

Subject

Computational Theory and Mathematics,Hardware and Architecture,Theoretical Computer Science

Link

https://digital-library.theiet.org/content/journals/10.1049/ip-cdt_20045019?crawler=true&mimetype=application/pdf

Reference120 articles.

1. International SEMATECH, ‘The international technology roadmap for semiconductors (ITRS)’, 2001 Edition, http://public.itrs.net/Files/2001ITRS/Home.htm

2. Introducing core-based system design

3. Testing embedded-core-based system chips

4. Kapur, R., and Williams, T.W.: ‘Manufacturing test of SoCs’. ATS, 2002, pp. 317–319

5. Abramovici, M., Breuer, M., and Friedman, A.: ‘Digital systems testing and testable design’, (IEEE Press 1990)

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