Internal write‐back and read‐before‐write schemes to eliminate the disturbance to the half‐selected cells in SRAMs-Reference-Cited by-同舟云学术

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Internal write‐back and read‐before‐write schemes to eliminate the disturbance to the half‐selected cells in SRAMs

Published:2018-04-26 Issue:4 Volume:12 Page:460-466
ISSN:1751-858X
Container-title:IET Circuits, Devices & Systems
language:en
Short-container-title:IET Circuits, Devices & Systems

Author:

Pasandi Ghasem¹^ORCID,Pedram Massoud¹

Affiliation:

1. Department of Electrical Engineering‐SystemsUniversity of Southern CaliforniaLos AngelesCA90089USA

Publisher

Institution of Engineering and Technology (IET)

Subject

Electrical and Electronic Engineering,Control and Systems Engineering

Link

https://onlinelibrary.wiley.com/doi/pdf/10.1049/iet-cds.2017.0227

Reference34 articles.

1. Radiation Effects And Soft Errors In Integrated Circuits And Electronic Devices

2. Effects of atmospheric neutrons on devices, at sea level and in avionics embedded systems

3. Mitra S. Sanda P. Seifert N.: ‘Soft errors: technology trends system effects and protection techniques’.13th IEEE Int. On‐Line Testing Symp. (IOLTS 2007) 2007 pp.4–4

4. Azarpeyvand A. Salehi M.E. Firouzi F. et al.: ‘Instruction reliability analysis for embedded processors’.IEEE 13th Int. Symp. on Design and Diagnostics of Electronic Circuits and Systems (DDECS) 2010 pp.20–23

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1. A FinFET-based low-power, stable 8T SRAM cell with high yield;AEU - International Journal of Electronics and Communications;2024-02

2. A low-power SRAM design with enhanced stability and I_ON/I_OFF ratio in FinFET technology for wearable device applications;International Journal of Electronics;2023-07-25

3. High-Stability and High-Speed 11T CNTFET SRAM Cell for MIMO Applications;Journal of Circuits, Systems and Computers;2023-06-12

4. Energy-Efficient Single-Ended Read/Write 10T Near-Threshold SRAM;IEEE Transactions on Circuits and Systems I: Regular Papers;2023-05

5. Review of 6T SRAM for Embedded Memory Applications;Indian Journal of VLSI Design;2023-03-30

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