Direct parameter extraction method for deep submicrometer metal oxide semiconductor field effect transistor small signal equivalent circuit
Author:
Publisher
Institution of Engineering and Technology (IET)
Subject
Electrical and Electronic Engineering
Link
https://digital-library.theiet.org/content/journals/10.1049/iet-map.2008.0162?crawler=true&mimetype=application/pdf
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1. MOSFET Modeling for RF IC Design
2. Microwave CMOS-device physics and design
3. Small-signal and temperature noise model for MOSFETs
4. Characteristics of deep-submicrometer MOSFET and its empirical nonlinear RF model
5. A new method for phemt noise-parameter determination based on 50-Ω noise measurement system
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