Sensitivity analysis and uncertainty estimation for nanoscale MOSFET-Reference-Cited by-同舟云学术

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Sensitivity analysis and uncertainty estimation for nanoscale MOSFET

Published:2018-04-26 Issue:5 Volume:31 Page:e2346
ISSN:0894-3370
Container-title:International Journal of Numerical Modelling: Electronic Networks, Devices and Fields
language:en
Short-container-title:Int J Numer Model

Author:

Yu Panpan¹^ORCID,Sun Ling²,Cheng Jiali³,Gao Jianjun¹

Affiliation:

1. School of Information Science and Technology; East China Normal University; Shanghai 200062 China

2. Jiangsu Key Laboratory of ASIC Design; Nantong University; Nantong 226019 China

3. School of Electronics and Information Engineering; University of Science and Technology of Suzhou; Suzhou 215000 China

Funder

Science and Technology Project of Lianyungang

Natural Science Foundation of Jiangsu Province

National Natural Science Foundation of China

Publisher

Wiley

Subject

Electrical and Electronic Engineering,Computer Science Applications,Modeling and Simulation

Link

http://onlinelibrary.wiley.com/wol1/doi/10.1002/jnm.2346/fullpdf

Reference14 articles.

1. Accurate modeling and parameter extraction for MOS transistors valid up to 10 GHz;Jen;IEEE Trans Electron Devices,1999

2. MOSFET bias dependent series resistance extraction from RF measurement;Torres-Torres;Electron Lett,2003

3. A method to determine the gate bias-dependent and gate bias-independent components of MOSFET series resistance from S-parameters;Torres-Rios;IEEE Trans Electron Devices,2006

4. Accurate RF extraction method for resistances and inductances of sub-0.1 μm CMOS transistors;Lee;Electron Lett,2005

5. Direct parameter extraction method for deep submicrometer metal oxide semiconductor field effect transistor small signal equivalent circuit;Gao;IET Microwaves Antennas Propag,2009

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1. Sensitivity analysis and uncertainty estimation in small‐signal modeling for InP HBT (invited paper);International Journal of Numerical Modelling: Electronic Networks, Devices and Fields;2020-12-20

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