MOSFET bias dependent series resistance extraction from RF measurements
Author:
Publisher
Institution of Engineering and Technology (IET)
Subject
Electrical and Electronic Engineering
Link
https://digital-library.theiet.org/content/journals/10.1049/el_20030936?crawler=true&mimetype=application/pdf
Reference4 articles.
1. A semianalytical parameter extraction of a SPICE BSIM3v3 for RF MOSFET's using S-parameters
2. Practical accuracy analysis of some existing effective channel length and series resistance extraction methods for MOSFET's
3. Direct extraction of LDMOS small signal parameters from off-state measurements
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