Simultaneous capture and shift power reduction test pattern generator for scan testing
Author:
Publisher
Institution of Engineering and Technology (IET)
Subject
Electrical and Electronic Engineering,Hardware and Architecture,Software
Link
https://digital-library.theiet.org/content/journals/10.1049/iet-cdt_20070088?crawler=true&mimetype=application/pdf
Reference21 articles.
1. The last byte - Yet another thiotimoline application
Cited by 11 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. On the Efficacy of Scan Chain Grouping for Mitigating IR-Drop-Induced Test Data Corruption;IEICE Transactions on Information and Systems;2021-06-01
2. Efficient Low-power Scan Test Method based on Exclusive Scan and Scan Chain Reordering;JOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE;2020-08-31
3. Scan Chain Grouping for Mitigating IR-Drop-Induced Test Data Corruption;2017 IEEE 26th Asian Test Symposium (ATS);2017-11
4. Test Pattern Modification for Average IR-Drop Reduction;IEEE Transactions on Very Large Scale Integration (VLSI) Systems;2016-01
5. Transient IR-Drop Analysis for At-Speed Testing Using Representative Random Walk;IEEE Transactions on Very Large Scale Integration (VLSI) Systems;2014-09
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