An analysis of low power testing using K ‐means clustering with reordering approach
Author:
Affiliation:
1. Assistant Professor Bannari Amman Institute of Technology, Sathyamangalam Erode India
2. Professor Bannari Amman Institute of Technology, Sathyamangalam Erode India
Publisher
Institution of Engineering and Technology (IET)
Subject
Electrical and Electronic Engineering
Link
https://onlinelibrary.wiley.com/doi/pdf/10.1049/ell2.12210
Reference11 articles.
1. Double Hamming distance‐based 2D reordering method for scan‐in power reduction and test pattern compression
2. Test Data Compression and Power Reduction Using Similarity Based Reordering Technique for Wireless Systems
3. Weighted Transition Based Reordering, Columnwise Bit Filling, and Difference Vector: A Power-Aware Test Data Compression Method
4. Mehta U. Dasgupta K.S. Devashrayee N.M.:Hamming distance‐based reordering and column wise bit stuffing with difference vector: A better scheme for test data compression with run length‐based codes. In: Proceedings of23rd International Conference on VLSI Design Bangalore pp.33–38(2010)
5. Hamming distance‐based test vector reordering techniques for minimizing switching activity during testing of VLSI circuits;Paramasivam K.;Int. AMSE J. Modelling A,2007
Cited by 3 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. An analysis OF KNN model: Low power VLSI testing;SECOND INTERNATIONAL CONFERENCE ON CIRCUITS, SIGNALS, SYSTEMS AND SECURITIES (ICCSSS - 2022);2023
2. ZFSA2: A power aware X - bit filling approach for VLSI circuits;SECOND INTERNATIONAL CONFERENCE ON CIRCUITS, SIGNALS, SYSTEMS AND SECURITIES (ICCSSS - 2022);2023
3. Adaptive BIST for Concurrent On-Line Testing on Combinational Circuits;Electronics;2022-10-05
1.学者识别学者识别
2.学术分析学术分析
3.人才评估人才评估
"同舟云学术"是以全球学者为主线,采集、加工和组织学术论文而形成的新型学术文献查询和分析系统,可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容,当前同舟云学术共收录了国内外主流学术期刊6万余种,收集的期刊论文及会议论文总量共计约1.5亿篇,并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询!咨询电话:010-8811{复制后删除}0370
www.globalauthorid.com
TOP
Copyright © 2019-2024 北京同舟云网络信息技术有限公司 京公网安备11010802033243号 京ICP备18003416号-3