Test Data Compression and Power Reduction Using Similarity Based Reordering Technique for Wireless Systems
Author:
Publisher
Springer Science and Business Media LLC
Subject
Electrical and Electronic Engineering,Computer Science Applications
Link
http://link.springer.com/content/pdf/10.1007/s11277-016-3196-x.pdf
Reference22 articles.
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2. Chandra, A., & Chakrabarty, K. (2003). Test Data Compression and test resource partitioning for system-on-a-chip using frequency-directed run-length (FDR) codes. IEEE Transactions on Computers, 52(8), 1076–1088.
3. Feng, J. & Li, G. (2008). A test data compression method for system-on-a- chip.In Proceedings of the 4th IEEE International Symposium on Electronic Design, Test and Applications.
4. Touba, N. A. (2006). Survey of test vector compression techniques. IEEE Design & Test Magazine, 23(4), 294–303.
5. Chandra, A., & Chakrabarty, K. (2001). Efficient test data compression and decompression for system-on-a-chip using internal scan chains and Golomb coding. In DATE ‘01: Conference on design, automation and test in Europe.
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